超聲波水浸C掃描檢測系統(tǒng)用于對材料科學(xué)、加工工藝、焊接工藝等相應(yīng)產(chǎn)品的內(nèi)部缺陷進(jìn)行檢測。利用伺服運(yùn)動(dòng)控制系統(tǒng)，帶動(dòng)超聲換能器，對產(chǎn)品進(jìn)行水浸C 掃描檢測。超聲波水浸C掃描檢測系統(tǒng)全波列采集超聲波信號(hào)，利用成像算法和數(shù)據(jù)圖像處理功能，對產(chǎn)品內(nèi)部的缺陷進(jìn)行有效識(shí)別，得到內(nèi)部清晰圖像，并統(tǒng)計(jì)分析缺陷位置、形狀和尺寸，生成自定義報(bào)告。

The ultrasonic C-scan inspection system is used for internal defect detection of corresponding products in materials science, processing technology and welding process. It uses servo motion control system to drive ultrasonic transducer for water immersion C-scan detection of products. The full wave column collects ultrasonic signals. It uses the imaging algorithms and data image processing functions to effectively identify defects inside the product, obtain clear images of the interior and statistically analyze the defect location, shape and size to generate custom reports.

產(chǎn)品特點(diǎn) FEATURES

適用產(chǎn)品：金屬和非金屬原材料檢測(板材、棒 材 、 復(fù) 合 材 料 ) , 焊 接 焊 縫 、 各 種 粘 接 ( 板 材粘 接 、 蜂 窩 粘 接 等 ) ;        

Applicable products: metal and non-metal raw material inspection (plates,bars and composite materials), welding seam and a variety of bonding (platebonding and honeycomb bonding);

檢測結(jié)果穩(wěn)定性、 一致性高；        

High stability and consistency of test results;

高速定位，快速成像；        

High-speed positioning and rapid imaging;

操作簡單，使用安全，檢測結(jié)果格式多樣化；        

Simple operation, applicable safety, flexible and varied formats of test results;

技 術(shù) 參 數(shù) SPECIFICATIONS

運(yùn)動(dòng)系統(tǒng)/Motion system          

XY軸掃描范圍/Scanning range of XY axis  600*600mm(可定制/Customizable)

掃描速度/Scanning speed  200~500mm/s

重復(fù)精度/Repetition precision  ±0.01mm

多軸運(yùn)動(dòng)方式/Multi-axis motion mode  3軸、4軸，最高可擴(kuò)展至8軸 3-axis, 4-axis, expandable up

超聲發(fā)射接收/Ultrasonic emission and reception        

工作頻率范圍/Operating frequency range 1MHz~20MHz

激勵(lì)脈沖形式/Excitation pulseform 方波/Square wave

工作溫度/Working temperature -10℃~+50℃

采樣率/Sampling rate 100MHz,8位(可定制)/8-digit (Customizable)

重復(fù)頻率/Repetition frequency 5khz

通道數(shù)量/Number of channels 雙通道/2 channels

脈沖發(fā)射電壓/Pulse emission voltage 20~400V可調(diào)，步進(jìn)1V 20~400V adjustable, step IV

增益調(diào)節(jié)/Gain adjustment 49dB～+59dB,1dB步進(jìn)-49dB～+59dB,1dB step 

軟件功能/Software functionA、B、C、D掃描圖像 界面跟蹤、區(qū)域重掃

A,B,C, D scanning imaging Interface tracking, area re-scanning

多種特征成像方式/Multiple imaging methods 

多種數(shù)據(jù)處理、圖像處理方式 Multiple data processing and image processing methods

缺陷定位統(tǒng)計(jì)分析/ 數(shù)據(jù)庫統(tǒng)計(jì)、自定義報(bào)告模板/

Statistical analysis of defect location 

Database statistics, customizable report template

超聲波C 掃描檢測系統(tǒng) DLT-QC-210

一、產(chǎn)品介紹 INTRODUCTION

超聲掃描顯微鏡DANA-QC210 用于對材料科學(xué)，半導(dǎo)體行業(yè)等相應(yīng)產(chǎn)品的內(nèi)部缺陷檢測，利用高速線性馬達(dá)運(yùn)動(dòng)系統(tǒng)，帶動(dòng)高頻超聲換能器，對產(chǎn)品進(jìn)行水浸C 掃描檢測，全波列采集超聲波信號(hào)，利用成像算法和數(shù)據(jù)圖像處理功能，對產(chǎn)品內(nèi)部的缺陷進(jìn)行有效識(shí)別，得到內(nèi)部清晰圖像，并統(tǒng)計(jì)分析缺陷位置、形狀和尺寸，生成自定義報(bào)告。

二、產(chǎn)品特點(diǎn) FEATURES

適用產(chǎn)品：芯片、塑料封裝IC、PCB、金屬基板、晶片、半導(dǎo)體電子行業(yè)；        Applicable products: chips, plastic packaging IC, PCB, metal substrates,

檢測結(jié)果穩(wěn)定性、 一致性高；        

High stability and consistency of test results;

高速定位，快速成像；        

High-speed positioning and fast imaging;

操作簡單，使用安全，檢測結(jié)果格式多樣化；        

Simple operation, applicable safety, flexible and varied formats of test results;

技術(shù)參數(shù) SPECIFICATIONS

運(yùn)動(dòng)系統(tǒng)/Motion system          

XY軸掃描范圍/Scanning range of XY axis  300*300mm   (可定制/Customizable)

掃描速度/Scanning speed 1000mm/s

重復(fù)精度/Repetition precision 1um

超聲發(fā)射接收/ Ultrasonic emission and reception

工作頻率范圍/Operating frequency range 0.5MHz~60MHz

激勵(lì)脈沖形式/Excitation pulseform 方波/Square wave

工作溫度/Working temperature -10℃~+50℃

采樣率/Sampling rate 100MHz, 可支持，GHz/100MHz,Support IGHz

重復(fù)頻率/Repetition frequency  20khz

數(shù)據(jù)傳輸率/Data transfer rate  5G

采樣點(diǎn)數(shù)/Sampling points 4K (可定制)/4K(Customizable）

增益調(diào)節(jié)/Gain adjustment -13~66dB 連續(xù)1dB 可調(diào)/- 13~66dB  continuous  IdB  adjustable

軟件功能/Software function        

A、B、C、D掃描圖像 界面跟蹤、區(qū)域重掃

A,B,C, D scanning imaging Interface tracking, area re-scanning

多種特征成像方式/Multiple imaging methods 多種數(shù)據(jù)處理、圖像處理方式

Multiple data processing and image processing methods

缺陷定位統(tǒng)計(jì)分析/                                                  數(shù)據(jù)庫統(tǒng)計(jì)、自定義報(bào)告模板/

Statistical analysis of defect location Database statistics, customizable report template